Modification of the X-ray diffraction signal intensity at long-time exposure from Hierarchical architecture of spider attachment setae reconstructed from scanning nanofocus X-ray diffraction data
journal contributionposted on 17.01.2019 by Clemens F. Schaber, Silja Flenner, Anja Glisovic, Igor Krasnov, Martin Rosenthal, Hergen Stieglitz, Christina Krywka, Manfred Burghammer, Martin Müller, Stanislav N. Gorb
Any type of content formally published in an academic journal, usually following a peer-review process.
Figure S1. Modification of the X-ray diffraction signal intensity at 400-fold successive exposure by 0.1 s of an attachment hair to the focused X-ray beam at the ESRF. (a) Decrease of the equatorial 110 chitin wide-angle diffraction reflection. The exponential fit yields a half-life of signal intensity of 6.9 s exposure as indicated by the dashed line. The data points are shifted to the zero line of the asymptotic line fit. Negative intensity values are caused by subtraction of the background signal. (b) Increase of the SAXS signal intensity.